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2D material Detector for mechanical exfoliated flakes

automatically detects two-dimensional materials created through mechanical exfoliation. It reduce the time many researchers waste searching and recording locations using an optical microscope. Compatible for all 2d materials including unknown van der Waals crystal. It can also help with dimensional material discovery research.

Principle using interference effects




  1. scan range: 5cm x 5cm maximum

  2. materials: graphene, hBN, TMDC, etc including all 2d materials

  3. substrate: SiO2/Si, glass, 

  4. scan speed: 0.5 um^2/sec.

  5. accuracy: single layer (for graphene)

  6. image format: jpg file

  7. coordinate: recorded in file name

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